BS ISO 17470:2014现行
Microbeam Analysis - Electron Probe Microanalysis - Guidelines For Qualitative Point Analysis By Wavelength Dispersive X-Ray Spectrometry
出版：British Standards Institution
专家解读视频
基本信息
标准编号： BS ISO 17470:2014
发布时间：2014/1/31 0:00:00
标准类别：Standard
出版单位：British Standards Institution
标准页数：22
标准简介
Provides guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume (on a (mu)m[3] scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
标准备注
Supersedes 03/303319 DC (10/2004)
