NS EN 15991:2011被替代
Testing Of Ceramic And Basic Materials - Direct Determination Of Mass Fractions Of Impurities In Powders And Granules Of Silicon Carbide By Inductively Coupled Plasma Optical Emission Spectrometry (Icp Oes) With Electrothermal Vaporisation (Etv)
出版：Norwegian Standards (Norges Standardiseringsforbund)
专家解读视频
Describes a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide. Dependent on element, wavelength, plasma conditions and weight, this test method is applicable for mass contents of the above trace contaminations from about 0,1 mg/kg to about 1000 mg/kg, after evaluation also from 0,001 mg/kg to about 5000 mg/kg.
EN 15991:2015 - Identical
