
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
出版:American Society for Testing and Materials

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基本信息
标准编号: ASTM F76-86(2002)
发布时间:1986/10/31 0:00:00
标准类别:Standard
出版单位:American Society for Testing and Materials
标准页数:13
标准简介
CONTAINED IN VOL. 10.04, 2006Gives methods for measuring resistivity and Hall coefficientof single-crystal semiconductor specimens, which differ substantially in requirements.
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