IEC 60147-2M废止
Essential Ratings And Characteristics Of Semiconductor Devices And General Principles Of Measuring Methods - General Principles Of Measuring Methods - Twelfth Supplement
出版：International Electrotechnical Committee
专家解读视频
基本信息
标准编号： IEC 60147-2M
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：73
标准简介
Deals with measuring methods for signal and voltage-regulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques or equipment; some others are newly described.
等同采用的国际标准
NEN EN 100012:1995 - Identical
