EIA JESD 22-A117:2011现行
Electrically Erasable Programmable Rom (Eeprom) Program/Erase Endurance And Data Retention Stress Test
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 22-A117:2011
发布时间：2011/10/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：23
标准简介
Establishes the ability of an EEPROM integrated circuit or an integrated circuit with an EEPROM module (such as a microprocessor) to sustain repeated data changes without failure (program/erase endurance) and to retain data for the expected life of the EEPROM (data retention). Provides the procedural requirements for performing valid endurance and retention tests based on a qualification specification.
标准备注
Supersedes EIA JESD 22 (07/2004)
本标准替代的旧标准
