BS QC 750100:1986+A2:1996现行
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
出版：British Standards Institution
专家解读视频
Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.
© British Standards Institution 2013
Amendment notes:
AMD 7208 published 15 October 1992
Amendment, January 2010. Amends and replaces BS QC 750000:1986
Document identifier notes:
Formerly BS QC 750000:1986.
IEC 60747-11 Ed. 1.0 - Identical
