EIA JESD 22-C101:2008被替代
Field-induced Charged-device Model Test Method For Electrostatic Discharge Withstand Thresholds Of Microelectronic Components
出版：JEDEC Solid State Technology Association
专家解读视频
基本信息
标准编号： EIA JESD 22-C101:2008
发布时间：2008/10/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：0
标准简介
Describes a uniform method for establishing charged-device model electrostatic discharge withstand thresholds. The charged-device-model simulates charging/discharging events that occur in production equipment and processes.
标准备注
Supersedes EIA JESD 22 (07/2004)
替代本标准的新标准
