IEC 60147-2 Ed. 1.0废止
Essential Ratings And Characteristics Of Semiconductor Devices And General Principles Of Measuring Methods - General Principles Of Measuring Methods
出版：International Electrotechnical Committee
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基本信息
标准编号： IEC 60147-2 Ed. 1.0
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：55
标准简介
SEE SUPPLEMENTS 147-2A TO MGives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in Publication 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
