ASTM E2444-05e1被替代
Terminology Relating to Measurements Taken on Thin, Reflecting Films
出版：American Society for Testing and Materials
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基本信息
标准编号： ASTM E2444-05e1
发布时间：2005/5/1 0:00:00
标准类别：Standard
出版单位：American Society for Testing and Materials
标准页数：3
标准简介
CONTAINED IN VOL. 03.01, 2007Defines terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials.
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