ASTM F1190-99(2005)被替代
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
出版：American Society for Testing and Materials
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基本信息
标准编号： ASTM F1190-99(2005)
发布时间：2005/1/1 0:00:00
标准类别：Standard
出版单位：American Society for Testing and Materials
标准页数：5
标准简介
CONTAINED IN VOL. 10.04, 2006Applies only to the exposure of unbiased silicon (SI) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation from a nuclear reactor source to determine the permanent damage in the components.
本标准替代的旧标准
替代本标准的新标准
