EIA JESD 22-A104:2005被替代
Temperature Cycling
出版：Joint Electronics Device Engineering Council (JEDEC)
专家解读视频
基本信息
标准编号： EIA JESD 22-A104:2005
发布时间：2005/5/1 0:00:00
标准类别：Standard
出版单位：Joint Electronics Device Engineering Council (JEDEC)
标准页数：16
标准简介
Provides a method for determining solid state devices capability to withstand extreme temperature cycling. Includes requirements that the worst-case load temperature must reach the specific extremes rather than just requiring that the chamber ambient temperature reach the extremes and ensures that the test specimens will reach the specified temperature extremes regardless of chamber loading.
标准备注
Supersedes EIA JESD 22 (07/2004)
本标准替代的旧标准
替代本标准的新标准
