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IEC 62433-2 Ed. 1.0被替代

EMC IC modelling Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

出版:International Electrotechnical Committee

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基本信息
标准编号: IEC 62433-2 Ed. 1.0
发布时间:2008/10/8 0:00:00
标准类别:Standard
出版单位:International Electrotechnical Committee
标准页数:43
标准简介

IEC 62433-2:2008 specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs. Basically, conducted emissions have two origins: - conducted emissions through power supply terminals and ground reference structures; - conducted emissions through input/output (I/O) terminals. The ICEM-CE model addresses those two types of origins in a single approach. This standard defines structures and components of the macro-model for EMI simulation taking into account the IC's internal activities. This standard gives general data, which can be implemented in different formats or languages such as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as default simulation environment to cover all the conducted emissions. This standard also specifies requirements for information that shall be incorporated in each ICEM-CE model or component part of the model for model circulation, but description syntax is not within the scope of this standard.

替代本标准的新标准

IEC 62433-2 Ed. 2.0

等同采用的国际标准

NF EN 62433-2:2007 - Identical

BS EN 62433-2:2010 - Identical