ASTM F980-92废止
Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
出版：American Society for Testing and Materials
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基本信息
标准编号： ASTM F980-92
发布时间：1992/1/1 0:00:00
标准类别：Standard
出版单位：American Society for Testing and Materials
标准页数：5
标准简介
CONTAINED IN VOL 10.04 1999Covers requirements and procedures for testing discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation.
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