DS EN 60749-24:2004现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 24: Accelerated Moisture Resistance - Unbiased Hast
出版：Danish Standards
专家解读视频
基本信息
标准编号： DS EN 60749-24:2004
发布时间：2004/6/14 0:00:00
标准类别：Standard
出版单位：Danish Standards
标准页数：16
标准简介
Defines the reliability of non-hermetic packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
等同采用的国际标准
EN 60749-24:2004 - Identical
