
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 7: INTERNAL MOISTURE CONTENT MEASUREMENT AND THE ANALYSIS OF OTHER RESIDUAL GASES
出版:International Electrotechnical Committee

专家解读视频
Describes the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device.
CEI EN 60749-7 : 2012 - Identical
I.S. EN 60749-7:2011 - Identical
PN EN 60749-7 : 2012 - Identical
BS EN 60749-7 : 2011 - Identical
DIN EN 60749-7 : 2012 - Identical
NEN EN IEC 60749-7 : 2011 - Identical
DS EN 60749-7 : 2011 - Identical