UNE-EN IEC 60749-17:2019现行
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (Endorsed by Asociación Espa?ola de Normalización in June of 2019.)
出版：Asociacion Espanola de Normalizacion
专家解读视频
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation.
IEC 60749-17:2019 - Identical
EN IEC 60749-17:2019 - Identical
IEC 60749-17:2019 - Identical
IEC 60749-17:2019 - Identical
EN IEC 60749-17:2019 - Identical
