
Semiconductor devices - Mechanical and climatic test methods Part 24: Accelerated moisture resistance; Unbiased HAST (IEC 47/1646/CD:2002)
出版:German Institute for Standardisation (Deutsches Institut für Normung)

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Semiconductor devices - Mechanical and climatic test methods Part 24: Accelerated moisture resistance; Unbiased HAST (IEC 47/1646/CD:2002)
出版:German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频