ISO/DIS 15632 (2002)被替代
Microbeam Analysis - Instrumental Specification For Energy Dispersive X-ray Spectrometers With Semiconductor Diode Detectors
出版：International Organization for Standardization
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基本信息
标准编号： ISO/DIS 15632 (2002)
标准类别：Draft
出版单位：International Organization for Standardization
标准页数：0
标准简介
Provides the most important quantities that characterise a X-ray semiconducting diode detector in connection with the signal-processing unit of an energy dispersive X-ray (EDS) spectrometer and gives minimum requirements for such spectrometers attached to an electron probe microanalyser (EPMA) or a scanning electron microscope (SEM).
替代本标准的新标准
