
Harmonized System Of Quality Assessment For Electronic Components - Discrete Semiconductor Devices - Sectional Specification
出版:British Standards Institution

专家解读视频
Forms part of the IEC Quality Assessment System for electronic components. It refers to discrete semi conductor devices and specifies quality assessment, test and measurement procedures.
© British Standards Institution 2013
Supersedes 80/28890 DC
Renumbered and superseded by BS QC750100(1986)
(08/2005)
IEC 60747-11 Ed. 1.0 - Identical