NEN ISO 17470:2004被替代
Microbeam Analysis - Electron Probe Microanalysis - Guidelines For Qualitative Point Analysis By Wavelength Dispersive X-ray Spectrometry
出版：Nederlands Normalisatie Instituut
专家解读视频
基本信息
标准编号： NEN ISO 17470:2004
发布时间：2004/9/1 0:00:00
标准类别：Standard
出版单位：Nederlands Normalisatie Instituut
标准页数：10
标准简介
Provides guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
等同采用的国际标准
ISO 17470:2004 - Identical
