NEN EN IEC 60749-31:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 31: Flammability Of Plastic-encapsulated Devices (internally Induced)
出版：Nederlands Normalisatie Instituut
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基本信息
标准编号： NEN EN IEC 60749-31:2003
发布时间：2003/8/1 0:00:00
标准类别：Standard
出版单位：Nederlands Normalisatie Instituut
标准页数：9
标准简介
Applies to semiconductor devices (discrete devices and integrated circuits). It's test objective is to determine the device ignites due to internal heating caused by excessive overloads.
