NF EN 60749-26:2006被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 26: Electrostatic Discharge (esd) Sensitivity Testing - Human Body Model (hbm)
出版：Association Francaise de Normalisation
专家解读视频
Presents a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
Indice de classement: C96-022-26. PR NF EN 60749-26 December 2002. (12/2002) PR NF EN 60749-26 April 2005 (04/2005)
SS EN 60749-26 Ed. 2 (2014) - Identical
BS EN 60749-26:2014 - Identical
EN 60749-26:2014 - Identical
BS EN 60749-26:2006 - Identical
DIN EN 60749-26 (2007-01) - Identical
NBN EN 60749-26:2007 - Identical
I.S. EN 60749-26:2006 - Identical
IEC 60749-26 Ed. 2.0 - Identical
SS EN 60749-26 Ed. 1 (2006) - Identical
