DS EN 60749-38:2008现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 38: Soft Error Test Method For Semiconductor Devices With Memory
出版：Danish Standards
专家解读视频
基本信息
标准编号： DS EN 60749-38:2008
发布时间：2008/8/13 0:00:00
标准类别：Standard
出版单位：Danish Standards
标准页数：20
标准简介
Specifies a procedure for measuring the data retention capability of semiconductor devices with memory when subjected to energetic particles such as alpha radiation.
等同采用的国际标准
EN 60749-38:2008 - Identical
