
Testing Of Ceramic And Basic Materials - Direct Determination Of Mass Fractions Of Impurities In Powders And Granules Of Silicon Carbide By Inductively Coupled Plasma Optical Emission Spectrometry (Icp Oes) With Electrothermal Vaporisation (Etv)
出版:Italian Standards

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基本信息
标准编号: UNI EN 15991:2011
标准类别:Standard
出版单位:Italian Standards
标准页数:0
标准简介
Explains a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
替代本标准的新标准
等同采用的国际标准
EN 15991:2015 - Identical