EIA JESD 22-A103:2004被替代
High Temperature Storage Life
出版：JEDEC Solid State Technology Association
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基本信息
标准编号： EIA JESD 22-A103:2004
发布时间：2004/11/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：0
标准简介
Applies for evaluation, screening, monitoring, and/or qualification of all solid state devices. High Temperature storage test is typically used to determine the effect of time and temperature, understorage conditions, for thermally activated failure mechanisms of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms).
标准备注
Supersedes EIA JESD 22 (07/2004)
本标准替代的旧标准
替代本标准的新标准
