NEN 10747-11:1986现行
Semiconductor Devices - Part 11: Sectional Specification For Discrete Devices
出版：Nederlands Normalisatie Instituut
专家解读视频
基本信息
标准编号： NEN 10747-11:1986
发布时间：1986/6/1 0:00:00
标准类别：Standard
出版单位：Nederlands Normalisatie Instituut
标准页数：50
标准简介
Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, tests and measurement procedures required for the assessment of semiconductor devices.
等同采用的国际标准
IEC 60747-11 Ed. 1.0 - Identical
