EIA JESD 22-C100:1990废止
High Temperature Continuity
出版：JEDEC Solid State Technology Association
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基本信息
标准编号： EIA JESD 22-C100:1990
发布时间：1990/4/1 0:00:00
标准类别：Standard
出版单位：JEDEC Solid State Technology Association
标准页数：0
标准简介
Determines the integrity of internal connections on solid state devices under high temperature conditions. The connections may function at room temperature, but exhibit open or high resistance at high temperature due to the effect of thermal expansion which is commonly known as "Thermal Intermittent". It is intended for n on-cavity type packages. The high temperature continuity test is considered non-destructive. It is intended for use as a 100% screen, lot acceptance, process monitor, or for qualification testing.
标准备注
Supersedes EIA JESD 22 (07/2004)
本标准替代的旧标准
