
Semiconductor devices - Micro-electromechanical devices Part 11: Test method for linear thermal expansion coefficients of MEMS materials (IEC 47F/49/CD:2010)
出版:German Institute for Standardisation (Deutsches Institut für Normung)

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Semiconductor devices - Micro-electromechanical devices Part 11: Test method for linear thermal expansion coefficients of MEMS materials (IEC 47F/49/CD:2010)
出版:German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频