
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 11: Rapid Change Of Temperature - Two-Fluid-Bath Method
出版:Danish Standards

专家解读视频
基本信息
标准编号: DS EN 60749-11:2002
发布时间:2003/1/8 0:00:00
标准类别:Standard
出版单位:Danish Standards
标准页数:24
标准简介
Specifies the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.
标准备注
COR 1 is also available in French. (08/2010)
等同采用的国际标准
EN 60749-11:2002 - Identical