DS EN 60749-32 : 2004 AMD 1 2010现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
出版：Danish Standards
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基本信息
标准编号： DS EN 60749-32 : 2004 AMD 1 2010
标准类别：Standard
出版单位：Danish Standards
标准页数：0
标准简介
Pertains to semiconductor device (discrete devices and integrated circuits). The aim of this test is to determine whether the device ignites due to external heating.
等同采用的国际标准
IEC 60749-32 : 1.1 - Identical
EN 60749-32 : 2003 AMD 1 2010 - Identical
IEC 60749-32 : 1.1 - Identical
