IEEE 1671.6:2008被替代
Automatic Test Markup Language (atml) For Exchanging Automatic Test Information Via Xml: Exchanging Test Station Information
出版：Institute of Electrical and Electronics Engineers
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基本信息
标准编号： IEEE 1671.6:2008
发布时间：2008/12/17 0:00:00
标准类别：Standard
出版单位：Institute of Electrical and Electronics Engineers
标准页数：30
标准简介
Presents the definition of an exchange format, utilizing XML, for exchanging the test station information by defining the description of the test station (e.g., physical and electrical characteristics, components, capabilities/performance, and identification/classification).
替代本标准的新标准
