ASTM F1467-99(2005)被替代
Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
出版：American Society for Testing and Materials
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基本信息
标准编号： ASTM F1467-99(2005)
发布时间：2005/1/1 0:00:00
标准类别：Standard
出版单位：American Society for Testing and Materials
标准页数：18
标准简介
CONTAINED IN VOL. 10.04, 2006Covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having approximately equal to 10 ke V mean photon energy and approximately equal to 50 ke V maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.
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