DIN IEC 60749-26 : DRAFT 2011被替代
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) - COMPONENT LEVEL (IEC 47/2101A/CDV:2011)
出版：German Institute for Standardisation (Deutsches Institut für Normung)
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