IEC 62416 Ed. 1.0现行
Semiconductor devices - Hot carrier test on MOS transistors
出版：International Electrotechnical Committee
专家解读视频
基本信息
标准编号： IEC 62416 Ed. 1.0
发布时间：2010/4/26 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：20
标准简介
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
等同采用的国际标准
BS EN 62416:2010 - Identical
