专家解读视频
Applicable to measurements of drive level dependence (DLD) of quartz crystal units. Covers two test methods: A, based on the pi-network method in accordance with IEC 444-1, for use in the complete frequency range covered by this part of IEC 444 and B, an oscillator method for measuring fundamental mode crystal units in larger quantities, having fixed conditions.
BS EN 60444-6:2013 - Identical
SS EN 60444-6 Ed. 1 (1998) - Identical
SN EN 60444-6:1997 - Identical
BS EN 60444-6:1997 - Identical
DIN EN 60444-6 (1997-10) - Identical
NF EN 60444-6:2001 - Identical
I.S. EN 60444-6:1999 - Identical
