
Visual And Mechanical Inspection Multilayer Ceramic Chip Capacitors
出版:Joint Electronics Device Engineering Council (JEDEC)

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基本信息
标准编号: EIA 595:1993
发布时间:1993/12/7 0:00:00
标准类别:Standard
出版单位:Joint Electronics Device Engineering Council (JEDEC)
标准页数:0
标准简介
This document covers the general industry inspection requirements for multilayer ceramic chip capacitors. The devices selected for inspection may be examined under 10 to 20 power magnification to determine compliance with the requirements specified. Sampling plans or lot accept reject criteria shall be negotiated between the manufacturer and the user buyer.
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