
Semiconductor devices - Micro-electromechanical devices Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 47F/127/CD:2012)
出版:German Institute for Standardisation (Deutsches Institut für Normung)

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Semiconductor devices - Micro-electromechanical devices Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 47F/127/CD:2012)
出版:German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频