MDR 22 : LATEST已作废
MICROCIRCUIT SCREENING ANALYSIS
出版：The Reliability Information Analysis Center
专家解读视频
基本信息
标准编号： MDR 22 : LATEST
标准类别：Standard
出版单位：The Reliability Information Analysis Center
标准页数：0
标准简介
Contains screen fallout rates for integrated circuits which provide a valuable baseline for defining expected fallout values for various device types and stress screen variables. Digital, linear, interface and memory devices are covered in this document.
